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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Hardcover

Series: Frontiers in Electronic Testing, Book 34

Technology & Engineering

ISBN10: 0387465464
ISBN13: 9780387465463
Publisher: Springer
Published: Jun 21 2007
Pages: 328
Weight: 1.59
Height: 0.74 Width: 6.38 Depth: 9.29
Language: English

This book is essential to understand new test methodologies, algorithms and industrial practices. Without its insight into the physics of nano-metric technologies, it would be difficult to develop system-level test strategies that yield a high IC fault coverage. The work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. The 2nd edition of Defect Oriented Testing has been extensively updated with the addition of chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering to provide a link between defect sources and yield. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work.

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Sachdev, Manoj

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Technology & Engineering