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$153.99
{"Id":2800483,"Title":"Fault-Tolerance Techniques for Sram-Based FPGAs","Authors":["Kastensmidt, Fernanda Lima","Reis, Ricardo"],"ShortTitle":"Fault-Tolerance Techniques for Sram-Based FPGAs","Author":"Kastensmidt, Fernanda Lima","Ean":"9780387310688","Isbn":"0387310681","Publisher":"Springer","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1066640,12211266],"CategoryIds":[617,717,1098],"FormatId":1,"FamilyId":3776414,"SeriesId":43012,"LanguageId":56,"PriceMin":153.99,"PriceMax":153.99,"Desirability":1,"PublicationDate":"2006-06-14T00:00:00","Join":null}
$237.99
{"Id":2800819,"Title":"Digital Timing Measurements: From Scopes and Probes to Timing and Jitter","Authors":["Maichen, Wolfgang"],"ShortTitle":"Digital Timing Measurements: From Scopes and Probes to Timing and Jitter","Author":"Maichen, Wolfgang","Ean":"9780387314181","Isbn":"0387314180","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1066868],"CategoryIds":[617],"FormatId":1,"FamilyId":2208417,"SeriesId":43012,"LanguageId":56,"PriceMin":237.99,"PriceMax":237.99,"Desirability":1,"PublicationDate":"2006-08-11T00:00:00","Join":null}
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Bushnell, M.
Agrawal, Vishwani
Hardcover
$139.99
{"Id":4126081,"Title":"Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits","Authors":["Bushnell, M.","Agrawal, Vishwani"],"ShortTitle":"Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI\u2026","Author":"Bushnell, M.","Ean":"9780792379911","Isbn":"0792379918","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1605977,1605983],"CategoryIds":[617,883],"FormatId":1,"FamilyId":7605071,"SeriesId":43012,"LanguageId":56,"PriceMin":139.99,"PriceMax":139.99,"Desirability":1,"PublicationDate":"2000-11-30T00:00:00","Join":null}
$279.99
{"Id":4126172,"Title":"Formal Equivalence Checking and Design Debugging","Authors":["Shi-Yu Huang","Kwang-Ting (Tim) Cheng"],"ShortTitle":"Formal Equivalence Checking and Design Debugging","Author":"Shi-Yu Huang","Ean":"9780792381846","Isbn":"079238184X","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1598421,1606279],"CategoryIds":[617,877],"FormatId":1,"FamilyId":7736676,"SeriesId":43012,"LanguageId":56,"PriceMin":279.99,"PriceMax":279.99,"Desirability":1,"PublicationDate":"1998-06-30T00:00:00","Join":null}
Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard
Osseiran, Adam
Hardcover
$169.99
{"Id":4126508,"Title":"Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard","Authors":["Osseiran, Adam"],"ShortTitle":"Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test\u2026","Author":"Osseiran, Adam","Ean":"9780792386865","Isbn":"0792386868","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1063731],"CategoryIds":[617],"FormatId":1,"FamilyId":7856652,"SeriesId":43012,"LanguageId":56,"PriceMin":169.99,"PriceMax":169.99,"Desirability":1,"PublicationDate":"1999-10-31T00:00:00","Join":null}
Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques
Kunz, Wolfgang
Stoffel, Dominik
Hardcover
$169.99
{"Id":4127471,"Title":"Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques","Authors":["Kunz, Wolfgang","Stoffel, Dominik"],"ShortTitle":"Reasoning in Boolean Networks: Logic Synthesis and Verification Using\u2026","Author":"Kunz, Wolfgang","Ean":"9780792399216","Isbn":"0792399218","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1605836,1605841],"CategoryIds":[617,877],"FormatId":1,"FamilyId":7558965,"SeriesId":43012,"LanguageId":56,"PriceMin":169.99,"PriceMax":169.99,"Desirability":1,"PublicationDate":"1997-06-30T00:00:00","Join":null}
Oscillation-Based Test in Mixed-Signal Circuits
Huertas Sánchez, Gloria
Vázquez García de la Vega, Diego
Rueda Rueda, Adoración
Hardcover
$237.99
{"Id":14716418,"Title":"Oscillation-Based Test in Mixed-Signal Circuits","Authors":["Huertas S\u00E1nchez, Gloria","V\u00E1zquez Garc\u00EDa de la Vega, Diego","Rueda Rueda, Adoraci\u00F3n"],"ShortTitle":"Oscillation-Based Test in Mixed-Signal Circuits","Author":"Huertas S\u00E1nchez, Gloria","Ean":"9781402053146","Isbn":"1402053142","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[9591603,9591404,9592014],"CategoryIds":[617],"FormatId":1,"FamilyId":7616330,"SeriesId":43012,"LanguageId":56,"PriceMin":237.99,"PriceMax":237.99,"Desirability":1,"PublicationDate":"2006-11-06T00:00:00","Join":null}
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
Benso, Alfredo
Prinetto, Paolo
Hardcover
$169.99
{"Id":14717603,"Title":"Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation","Authors":["Benso, Alfredo","Prinetto, Paolo"],"ShortTitle":"Fault Injection Techniques and Tools for Embedded Systems Reliability\u2026","Author":"Benso, Alfredo","Ean":"9781402075896","Isbn":"1402075898","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[3195115,3195116],"CategoryIds":[617,877],"FormatId":1,"FamilyId":912429,"SeriesId":43012,"LanguageId":56,"PriceMin":169.99,"PriceMax":169.99,"Desirability":1,"PublicationDate":"2003-10-31T00:00:00","Join":null}
$219.99
{"Id":14717606,"Title":"A Designer\u0027s Guide to Built-In Self-Test","Authors":["Stroud, Charles E."],"ShortTitle":"Designer\u0027s Guide to Built-In Self-Test","Author":"Stroud, Charles E.","Ean":"9781402070501","Isbn":"1402070500","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[593326],"CategoryIds":[489,617],"FormatId":1,"FamilyId":1171062,"SeriesId":43012,"LanguageId":56,"PriceMin":219.99,"PriceMax":219.99,"Desirability":1,"PublicationDate":"2002-05-31T00:00:00","Join":null}
$153.99
{"Id":14717987,"Title":"Soc (System-On-A-Chip) Testing for Plug and Play Test Automation","Authors":["Chakrabarty, Krishnendu"],"ShortTitle":"Soc (System-On-A-Chip) Testing for Plug and Play Test Automation","Author":"Chakrabarty, Krishnendu","Ean":"9781402072055","Isbn":"1402072058","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1742321],"CategoryIds":[617,877],"FormatId":1,"FamilyId":8028778,"SeriesId":43012,"LanguageId":56,"PriceMin":153.99,"PriceMax":153.99,"Desirability":1,"PublicationDate":"2002-09-30T00:00:00","Join":null}
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
Hamdioui, Said
Hardcover
$153.99
{"Id":14718014,"Title":"Testing Static Random Access Memories: Defects, Fault Models and Test Patterns","Authors":["Hamdioui, Said"],"ShortTitle":"Testing Static Random Access Memories: Defects, Fault Models and Test\u2026","Author":"Hamdioui, Said","Ean":"9781402077524","Isbn":"1402077521","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[3195936],"CategoryIds":[617],"FormatId":1,"FamilyId":7856650,"SeriesId":43012,"LanguageId":56,"PriceMin":153.99,"PriceMax":153.99,"Desirability":1,"PublicationDate":"2004-03-31T00:00:00","Join":null}
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
Pavlov, Andrei
Sachdev, Manoj
Hardcover
$179.99
{"Id":14718055,"Title":"CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test","Authors":["Pavlov, Andrei","Sachdev, Manoj"],"ShortTitle":"CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies:\u2026","Author":"Pavlov, Andrei","Ean":"9781402083624","Isbn":"1402083629","Publisher":"Springer","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[12683405,12685371],"CategoryIds":[617,877],"FormatId":1,"FamilyId":1295579,"SeriesId":43012,"LanguageId":56,"PriceMin":179.99,"PriceMax":179.99,"Desirability":1,"PublicationDate":"2008-06-21T00:00:00","Join":null}
Fault Diagnosis of Analog Integrated Circuits
Kabisatpathy, Prithviraj
Barua, Alok
Sinha, Satyabroto
Paperback
$109.99
{"Id":15337424,"Title":"Fault Diagnosis of Analog Integrated Circuits","Authors":["Kabisatpathy, Prithviraj","Barua, Alok","Sinha, Satyabroto"],"ShortTitle":"Fault Diagnosis of Analog Integrated Circuits","Author":"Kabisatpathy, Prithviraj","Ean":"9781441938282","Isbn":"1441938281","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1062379,1062383,1062386],"CategoryIds":[617],"FormatId":2,"FamilyId":875126,"SeriesId":43012,"LanguageId":56,"PriceMin":109.99,"PriceMax":109.99,"Desirability":1,"PublicationDate":"2011-01-05T00:00:00","Join":null}
$109.99
{"Id":15337753,"Title":"Data Mining and Diagnosing IC Fails","Authors":["Huisman, Leendert M."],"ShortTitle":"Data Mining and Diagnosing IC Fails","Author":"Huisman, Leendert M.","Ean":"9781441937674","Isbn":"1441937676","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1061827],"CategoryIds":[617,1125],"FormatId":2,"FamilyId":12628686,"SeriesId":43012,"LanguageId":56,"PriceMin":109.99,"PriceMax":109.99,"Desirability":1,"PublicationDate":"2010-12-08T00:00:00","Join":null}
Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
Nicolici, Nicola
Al-Hashimi, Bashir M.
Paperback
$153.99
{"Id":15338272,"Title":"Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard","Authors":["Nicolici, Nicola","Al-Hashimi, Bashir M."],"ShortTitle":"Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4\u2026","Author":"Nicolici, Nicola","Ean":"9781441953155","Isbn":"1441953159","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[3193058,1758620],"CategoryIds":[489,617,877],"FormatId":2,"FamilyId":912437,"SeriesId":43012,"LanguageId":56,"PriceMin":153.99,"PriceMax":153.99,"Desirability":1,"PublicationDate":"2010-12-09T00:00:00","Join":null}
$153.99
{"Id":15338422,"Title":"On-Line Testing for VLSI","Authors":["Zorian, Yervant","Pradhan, Dhiraj","Nicolaidis, Michael"],"ShortTitle":"On-Line Testing for VLSI","Author":"Zorian, Yervant","Ean":"9781441950338","Isbn":"1441950338","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1179834,1572446,1606728],"CategoryIds":[617,877],"FormatId":2,"FamilyId":11657870,"SeriesId":43012,"LanguageId":56,"PriceMin":153.99,"PriceMax":153.99,"Desirability":1,"PublicationDate":"2010-12-06T00:00:00","Join":null}
$153.99
{"Id":15338548,"Title":"Economics of Electronic Design, Manufacture and Test","Authors":["Abadir, M.","Ambler, T."],"ShortTitle":"Economics of Electronic Design, Manufacture and Test","Author":"Abadir, M.","Ean":"9781441951427","Isbn":"1441951423","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1607906,1607909],"CategoryIds":[617],"FormatId":2,"FamilyId":7542648,"SeriesId":43012,"LanguageId":56,"PriceMin":153.99,"PriceMax":153.99,"Desirability":1,"PublicationDate":"2010-12-07T00:00:00","Join":null}
Verification by Error Modeling: Using Testing Techniques in Hardware Verification
Radecka, Katarzyna
Zilic, Zeljko
Paperback
$109.99
{"Id":15339096,"Title":"Verification by Error Modeling: Using Testing Techniques in Hardware Verification","Authors":["Radecka, Katarzyna","Zilic, Zeljko"],"ShortTitle":"Verification by Error Modeling: Using Testing Techniques in Hardware\u2026","Author":"Radecka, Katarzyna","Ean":"9781441954022","Isbn":"1441954023","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[3195487,3192719],"CategoryIds":[617,877],"FormatId":2,"FamilyId":912441,"SeriesId":43012,"LanguageId":56,"PriceMin":109.99,"PriceMax":109.99,"Desirability":1,"PublicationDate":"2010-12-07T00:00:00","Join":null}
$153.99
{"Id":15339118,"Title":"Soc (System-On-A-Chip) Testing for Plug and Play Test Automation","Authors":["Chakrabarty, Krishnendu"],"ShortTitle":"Soc (System-On-A-Chip) Testing for Plug and Play Test Automation","Author":"Chakrabarty, Krishnendu","Ean":"9781441953070","Isbn":"1441953078","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[1742321],"CategoryIds":[617,877],"FormatId":2,"FamilyId":8028778,"SeriesId":43012,"LanguageId":56,"PriceMin":153.99,"PriceMax":153.99,"Desirability":1,"PublicationDate":"2011-12-12T00:00:00","Join":null}
Elements of Stil: Principles and Applications of IEEE Std. 1450
Maston, Gregory A.
Taylor, Tony R.
Villar, Julie N.
Paperback
$237.99
{"Id":15602095,"Title":"Elements of Stil: Principles and Applications of IEEE Std. 1450","Authors":["Maston, Gregory A.","Taylor, Tony R.","Villar, Julie N."],"ShortTitle":"Elements of Stil: Principles and Applications of IEEE Std. 1450","Author":"Maston, Gregory A.","Ean":"9781461350897","Isbn":"1461350891","Publisher":"Springer Nature","IsOnShelf":false,"IsIngramAvailable":true,"IsBestSeller":false,"IsRecentArrival":false,"ConditionIds":[1],"GroupIds":[],"ContributorIds":[3195378,3195379,3195380],"CategoryIds":[617,877],"FormatId":2,"FamilyId":7585587,"SeriesId":43012,"LanguageId":56,"PriceMin":237.99,"PriceMax":237.99,"Desirability":1,"PublicationDate":"2012-10-30T00:00:00","Join":null}