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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Data Mining and Diagnosing IC Fails

Data Mining and Diagnosing IC Fails

Huisman, Leendert M.

Paperback

Series: Frontiers in Electronic Testing, Book 31

Technology & EngineeringProgramming

ISBN10: 1441937676
ISBN13: 9781441937674
Publisher: Springer Nature
Published: Dec 8 2010
Pages: 250
Weight: 0.85
Height: 0.57 Width: 6.14 Depth: 9.21
Language: English

There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques from other data analysis environments are appropriate for analyzing IC fails, but have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. The description techniques and analysis routines are sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.

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