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612-822-4611
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test

CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test

Paperback

Series: Frontiers in Electronic Testing, Book 40

Technology & EngineeringGeneral Computers

ISBN10: 904817855X
ISBN13: 9789048178551
Publisher: Springer
Published: Oct 28 2010
Pages: 194
Weight: 0.67
Height: 0.45 Width: 6.14 Depth: 9.21
Language: English

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

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Pavlov, Andrei

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General Computers