• Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
X-Ray Scattering Fr Semiconductors(2ed)

X-Ray Scattering Fr Semiconductors(2ed)

Hardcover

Technology & EngineeringPhysics

ISBN10: 1860943608
ISBN13: 9781860943607
Publisher: Imperial College Press
Published: Jul 18 2003
Pages: 316
Weight: 1.47
Height: 0.95 Width: 6.06 Depth: 9.50
Language: English

This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.

Also from

Fewster Paul F

Also in

Technology & Engineering