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X-Ray Scattering from Semiconductors and Other Materials (3rd Edition)

X-Ray Scattering from Semiconductors and Other Materials (3rd Edition)

Hardcover

Technology & EngineeringPhysics

ISBN10: 9814436925
ISBN13: 9789814436922
Publisher: World Scientific Publishing Company
Published: May 1 2015
Pages: 512
Weight: 1.90
Height: 1.20 Width: 6.10 Depth: 9.10
Language: English

This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included.

Also from

Fewster, Paul F.

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Physics