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X-Ray Scattering from Semiconductors (2nd Edition)

X-Ray Scattering from Semiconductors (2nd Edition)

Hardcover

Technology & EngineeringPhysics

ISBN10: 1860943608
ISBN13: 9781860943607
Publisher: Imperial College Press
Published: Jul 8 2003
Pages: 316
Weight: 1.47
Height: 0.95 Width: 6.06 Depth: 9.50
Language: English

This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.

Also from

Fewster, Paul F.

Also in

Technology & Engineering