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Test and Design-For-Testability in Mixed-Signal Integrated Circuits

Test and Design-For-Testability in Mixed-Signal Integrated Circuits

Paperback

Technology & Engineering

ISBN10: 1441954228
ISBN13: 9781441954220
Publisher: Springer Nature
Published: Dec 7 2010
Pages: 298
Weight: 0.90
Height: 0.70 Width: 6.10 Depth: 9.00
Language: English

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses.

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