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Test and Design-For-Testability in Mixed-Signal Integrated Circuits

Test and Design-For-Testability in Mixed-Signal Integrated Circuits

Hardcover

Technology & Engineering

ISBN10: 1402077246
ISBN13: 9781402077241
Publisher: Springer Nature
Published: Oct 18 2004
Pages: 298
Weight: 1.36
Height: 0.75 Width: 6.14 Depth: 9.21
Language: English

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses.

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