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Scanning Microscopy for Nanotechnology: Techniques and Applications

Scanning Microscopy for Nanotechnology: Techniques and Applications

Hardcover

Technology & Engineering

ISBN10: 0387333258
ISBN13: 9780387333250
Publisher: Springer Nature
Published: Nov 27 2006
Pages: 522
Weight: 2.31
Height: 1.08 Width: 6.30 Depth: 9.48
Language: English

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

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