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Scanning Microscopy for Nanotechnology: Techniques and Applications

Scanning Microscopy for Nanotechnology: Techniques and Applications

Paperback

Technology & EngineeringGeneral Science

ISBN10: 1441922091
ISBN13: 9781441922090
Publisher: Springer Nature
Published: Oct 29 2010
Pages: 522
Weight: 1.64
Height: 1.09 Width: 6.14 Depth: 9.21
Language: English
Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low kV Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and DualBeam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.

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