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Nanometer Technology Designs: High-Quality Delay Tests

Nanometer Technology Designs: High-Quality Delay Tests

Hardcover

Series: Frontiers in Electronic Testing, Book 38

Technology & Engineering

ISBN10: 0387764860
ISBN13: 9780387764863
Publisher: Springer Nature
Published: Dec 20 2007
Pages: 281
Weight: 1.37
Height: 0.86 Width: 6.58 Depth: 9.04
Language: English

Adopting new fabrication technologies not only provides higher integration and enhances performance, but also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz timing-related defects havv become a high proportion of the total chip defects. For nanometer technology designs, the stuck-at fault test alone cannot ensure a high quality level of chips. At-speed tests using the transition fault model has become a requirement in technologies below 180nm.

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