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612-822-4611
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

Paperback

Series: Springer Surface Sciences, Book 65

Technology & EngineeringChemistryPhysics

ISBN10: 3030092984
ISBN13: 9783030092986
Publisher: Springer
Published: Jan 4 2019
Pages: 521
Weight: 1.67
Height: 1.11 Width: 6.14 Depth: 9.21
Language: English


Presents the applications of Kelvin probe force microscopy in nanotechnology

Provides an in-depth description of a variety of theoretical and experimental aspects of the technique

Includes contributions by the leading experts in the field


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Technology & Engineering