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Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

Hardcover

Series: Springer Surface Sciences, Book 65

Technology & EngineeringChemistryPhysics

ISBN10: 3319756869
ISBN13: 9783319756868
Publisher: Springer
Published: Mar 19 2018
Pages: 521
Weight: 2.07
Height: 1.19 Width: 6.14 Depth: 9.21
Language: English


Presents the applications of Kelvin probe force microscopy in nanotechnology

Provides an in-depth description of a variety of theoretical and experimental aspects of the technique

Includes contributions by the leading experts in the field


Also in

Physics