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European Test Workshop (Etw 2000) [Postproceedings]

European Test Workshop (Etw 2000) [Postproceedings]

Paperback

Technology & Engineering

Currently unavailable to order

ISBN10: 0769507018
ISBN13: 9780769507019
Publisher: Ieee Computer Soc Pr
Published: Nov 1 2000
Pages: 181
Language: English
The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem

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