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Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits: Ipfa 2003: [scheduled, 7 to 11 July, 2003,

Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits: Ipfa 2003: [scheduled, 7 to 11 July, 2003,

Hardcover

Technology & Engineering

Currently unavailable to order

ISBN10: 0780377222
ISBN13: 9780780377226
Publisher: Inst Of Electrical & Electroni
Published: Jan 1 2003
Pages: 220
Language: English
This text covers topics on: advanced failure analysis techniques; advanced interconnects; dielectrics and hot-carrier reliabilty; EOS/ESD and CMOS latchup; practical issues in building-in reliability; and reliability and failure analysis in specialist devices.

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Technology & Engineering