Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Design for At-Speed Test, Diagnosis and Measurement

Design for At-Speed Test, Diagnosis and Measurement

Nadeau-Dostie, Benoit

Paperback

Series: Frontiers in Electronic Testing, Book 15

Technology & EngineeringGeneral Computers

ISBN10: 1475782918
ISBN13: 9781475782912
Publisher: Springer Nature
Published: Apr 26 2013
Pages: 239
Weight: 1.01
Height: 0.55 Width: 7.00 Depth: 10.00
Language: English
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a must read' before any DFT is attempted.

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