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Thin Film Analysis by X-Ray Scattering

Thin Film Analysis by X-Ray Scattering

Hardcover

Technology & Engineering

ISBN10: 3527310525
ISBN13: 9783527310524
Publisher: Wiley-Vch
Published: Feb 1 2006
Pages: 378
Weight: 1.84
Height: 0.92 Width: 6.84 Depth: 9.66
Language: English
With contributions by Paul F. Fewster and Christoph Genzel

While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications.

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Technology & Engineering