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Test and Diagnosis for Small-Delay Defects

Test and Diagnosis for Small-Delay Defects

Hardcover

Technology & EngineeringGeneral Computers

ISBN10: 1441982965
ISBN13: 9781441982964
Publisher: Springer Nature
Published: Sep 27 2011
Pages: 212
Weight: 1.11
Height: 0.56 Width: 6.14 Depth: 9.21
Language: English
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

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