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Test and Diagnosis for Small-Delay Defects

Test and Diagnosis for Small-Delay Defects

Paperback

Technology & EngineeringGeneral Computers

ISBN10: 1489989528
ISBN13: 9781489989529
Publisher: Springer Nature
Published: Nov 28 2014
Pages: 212
Weight: 0.73
Height: 0.49 Width: 6.14 Depth: 9.21
Language: English
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

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