Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Surface Analysis of Polymers by XPS and Static Sims

Surface Analysis of Polymers by XPS and Static Sims

Briggs, D.
Clarke, D. R.
Suresh, S.

Paperback

Series: Cambridge Solid State Science

Technology & EngineeringGeneral Science

ISBN10: 052101753X
ISBN13: 9780521017534
Publisher: Cambridge University Press
Published: Dec 15 2005
Pages: 216
Weight: 0.77
Height: 0.46 Width: 6.69 Depth: 9.61
Language: English
This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and SSIMS. He also includes details of case studies, emphasizing the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.

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