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Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs

Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs

Paperback

Technology & Engineering

ISBN10: 1475779496
ISBN13: 9781475779493
Publisher: Springer Nature
Published: May 31 2013
Pages: 113
Weight: 0.43
Height: 0.28 Width: 6.14 Depth: 9.21
Language: English
As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally, static timing analysis tools have ignored cross coupling effects between wires altogether. Newer tools simply approximate the coupling capacitance by a 2X Miller factor in order to compute the worst case delay. The latter approach not only reduces delay calculation accuracy, but can also be shown to underestimate the delay in certain scenarios.

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