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612-822-4611
Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization

Paperback

Technology & Engineering

Publisher Price: $49.99

ISBN10: 1606507273
ISBN13: 9781606507278
Publisher: Momentum Press
Published: Dec 16 2015
Pages: 178
Weight: 0.59
Height: 0.41 Width: 6.00 Depth: 9.00
Language: English

Spectroscopic Ellipsometry provides a good introduction to the basic theory of the technique and its common applications.

Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more.

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