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Scaling Effects on Metal-oxide-semiconductor Device Characteristics

Scaling Effects on Metal-oxide-semiconductor Device Characteristics

Hardcover

Technology & Engineering

ISBN10: 0530002337
ISBN13: 9780530002330
Publisher: Dissertation Discovery Co
Published: May 31 2019
Pages: 152
Weight: 1.42
Height: 0.38 Width: 8.50 Depth: 11.00
Language: English
Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, Scaling Effects on Metal-oxide-semiconductor Device Characteristics by Steven V. Walstra, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.

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