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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Structure and Electronic Properties of Ultrathin in Films on Si(111)

Structure and Electronic Properties of Ultrathin in Films on Si(111)

Terakawa, Shigemi

Hardcover

Series: Springer Theses

Technology & EngineeringChemistryPhysics

ISBN10: 9811968713
ISBN13: 9789811968716
Publisher: Springer Nature
Published: Nov 9 2022
Pages: 76
Weight: 0.65
Height: 0.39 Width: 5.83 Depth: 9.06
Language: English

This book reports the establishment of a single-atomic layer metal of In and a novel (In, Mg) ultrathin film on Si(111) surfaces. A double-layer phase of In called rect has been extensively investigated as a two-dimensional metal. Another crystalline phase called hex was also suggested, but it had not been established due to difficulty in preparing the sample. The author succeeded in growing the large and high-quality sample of the hex phase and revealed that it is a single-layer metal. The author also established a new triple-atomic layer (In, Mg) film with a nearly freestanding character by Mg deposition onto the In double layer. This work proposes a novel method to decouple ultrathin metal films from Si dangling bonds.

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