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Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms

Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms

Paperback

Series: Springer Advanced Microelectronics, Book 48

Technology & EngineeringGeneral MathematicsProbability & Statistics

ISBN10: 9402402853
ISBN13: 9789402402858
Publisher: Springer Nature
Published: Aug 23 2016
Pages: 192
Weight: 0.67
Height: 0.45 Width: 6.14 Depth: 9.21
Language: English

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits.

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