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Atomic Force Microscopy: A Concise Introduction

Atomic Force Microscopy: A Concise Introduction

Paperback

Technology & Engineering

ISBN10: 9819824303
ISBN13: 9789819824304
Publisher: World Scientific Publishing Company
Published: Feb 21 2026
Pages: 250
Weight: 0.65
Height: 0.46 Width: 6.00 Depth: 9.00
Language: English

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.

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