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Semiconductor Process Reliability in Practice

Semiconductor Process Reliability in Practice

Hardcover

Technology & Engineering

ISBN10: 007175427X
ISBN13: 9780071754279
Publisher: McGraw-Hill Companies
Published: Oct 31 2012
Pages: 624
Weight: 2.19
Height: 1.31 Width: 6.00 Depth: 9.00
Language: English
Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product.
Proven processes for ensuring semiconductor device reliability

Co-written by experts in the field, Semiconductor Process Reliability in Practice contains detailed descriptions and analyses of reliability and qualification for semiconductor device manufacturing and discusses the underlying physics and theory. The book covers initial specification definition, test structure design, analysis of test structure data, and final qualification of the process. Real-world examples of test structure designs to qualify front-end-of-line devices and back-end-of-line interconnects are provided in this practical, comprehensive guide.

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