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Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
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612-822-4611
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy

Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy

Paperback

Series: Nanoscience and Technology

Technology & EngineeringGeneral SciencePhysics

ISBN10: 3662505576
ISBN13: 9783662505571
Publisher: Springer
Published: Oct 13 2016
Pages: 382
Weight: 1.23
Height: 0.82 Width: 6.14 Depth: 9.21
Language: English
Introduction.- Harmonic Oscillator.- Technical Aspects of Scanning Probe Microscopy.- Scanning Probe Microscopy Designs.- Electronics for Scanning Probe Microscopy.- Lock-In Technique.- Data Representation and Image Processing.- Artifacts in SPM.- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy.- Surface States.- Forces Between Tip and Sample.- Technical Aspects of Atomic force Microscopy (AFM).- Static Atomic Force Microscopy.- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy.- Intermittent Contact Mode/Tapping Mode.- Mapping of Mechanical Properties Using Force-Distance Curves.- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy.- Noise in Atomic Force Microscopy.- Quartz Sensors in Atomic force Microscopy.- Scanning Tunneling Microscopy.- Scanning Tunneling Spectroscopy (STS).- Vibrational Spectroscopy with the STM.- Spectroscopy and Imaging of Surface States.- Building Nanostructures Atom by Atom.

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