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Reliability and Yield in Nanoelectronics Manufacturing

Reliability and Yield in Nanoelectronics Manufacturing

Hardcover

Technology & EngineeringGeneral Science

Currently unavailable to order

ISBN10: 3032231892
ISBN13: 9783032231895
Publisher: Springer
Published: Jul 15 2026
Pages: 506
Weight: 2.39
Height: 1.15 Width: 6.49 Depth: 9.27
Language: English
This book is a definitive guide to improving yield and reliability in the modern semiconductor industry. Blending academic research with industrial expertise, it unveils the innovative Build-In Reliability (BIR) platform.

The book consists of 20 chapters, organized into four technical parts, deep diving into operational excellence and future perspectives. It emphasizes BIR's core components--Wafer-Level Reliability (WLR) and the AI-enhanced Build-In Reliability Diagnosis System (BIRDS), a knowledge-based tool designed to enable early detection of non-conformance.

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