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Reliability Wearout Mechanisms

Reliability Wearout Mechanisms

Hardcover

Series: IEEE Press Microelectronic Systems

Technology & Engineering

ISBN10: 0471731722
ISBN13: 9780471731726
Publisher: John Wiley & Sons
Published: Sep 1 2009
Pages: 640
Weight: 2.16
Height: 1.30 Width: 6.40 Depth: 9.30
Language: English
This invaluable resource tells the complete story of failure mechanisms--from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.

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Technology & Engineering