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Radiation Effects & Soft Errors ...(V34)

Radiation Effects & Soft Errors ...(V34)

Hardcover

Series: Selected Topics in Electronics and Systems, Book 34

Technology & Engineering

ISBN10: 9812389407
ISBN13: 9789812389404
Publisher: World Scientific Publishing Company
Published: Aug 13 2004
Pages: 348
Weight: 1.50
Height: 0.90 Width: 6.60 Depth: 9.80
Language: English
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

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