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3038 Hennepin Ave Minneapolis, MN
612-822-4611
Reliability of RoHS-Compliant 2D and 3D IC Interconnects

Reliability of RoHS-Compliant 2D and 3D IC Interconnects

Hardcover

Series: Electronic Engineering

Technology & Engineering

ISBN10: 0071753796
ISBN13: 9780071753791
Publisher: McGraw-Hill Companies
Published: Dec 22 2010
Pages: 640
Weight: 2.00
Height: 0.90 Width: 6.20 Depth: 9.10
Language: English
Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product.


Proven 2D and 3D IC lead-free interconnect reliability techniques

Reliability of RoHS-Compliant 2D and 3D IC Interconnects offers tested solutions to reliability problems in lead-free interconnects for PCB assembly, conventional IC packaging, 3D IC packaging, and 3D IC integration. This authoritative guide presents the latest cutting-edge reliability methods and data for electronic manufacturing services (EMS) on second-level interconnects, packaging assembly on first-level interconnects, and 3D IC integration on microbumps and through-silicon-via (TSV) interposers. Design reliable 2D and 3D IC interconnects in RoHS-compliant projects using the detailed information in this practical resource.

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Lau, John H.

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Technology & Engineering