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Probing Crystal Plasticity at the Nanoscales: Synchrotron X-Ray Microdiffraction

Probing Crystal Plasticity at the Nanoscales: Synchrotron X-Ray Microdiffraction

Paperback

Series: Springerbriefs in Applied Sciences and Technology

Technology & EngineeringPhysics

ISBN10: 9812873341
ISBN13: 9789812873347
Publisher: Springer Nature
Published: Jan 16 2015
Pages: 118
Weight: 0.42
Height: 0.28 Width: 6.14 Depth: 9.21
Language: English
Introduction.- Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab.- Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.- Electromigration-induced Plasticity in Cu Interconnects: The Texture Dependence.- Industrial Implications of Electromigration-induced Plasticity in Cu Interconnects: Plasticity-amplified Diffusivity.- . Indentation Size Effects in Single Crystal Cu as Revealed by Synchrotron X-ray Microdiffraction.- Smaller is Stronger: Size Effects in Uniaxially Compressed Au Submicron Single Crystal Pillars.- Conclusions and Future Directions.

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