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Photo-Excited Charge Collection Spectroscopy: Probing the Traps in Field-Effect Transistors

Photo-Excited Charge Collection Spectroscopy: Probing the Traps in Field-Effect Transistors

Paperback

Series: Springerbriefs in Physics

Technology & EngineeringGeneral Science

ISBN10: 9400763913
ISBN13: 9789400763913
Publisher: Springer Nature
Published: May 7 2013
Pages: 101
Weight: 0.38
Height: 0.24 Width: 6.14 Depth: 9.21
Language: English

Chapter 1. Device Stability and Photo-Excited Charge-Collection Spectroscopy.
1.1. Thin-film transistor architectures for photon probe measurements.
1.2. Device physics and equations for thin-film transistors.
1.3. Stability issues: Hysteresis by Gate Voltage Sweep.
1.4. Stability issues: Bias-Temperature-Stress.

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