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Controlling the aging of power transistors

Controlling the aging of power transistors

Paperback

Technology & Engineering

ISBN10: 6208939453
ISBN13: 9786208939458
Publisher: Our Knowledge Publishing
Published: Jun 17 2025
Pages: 88
Weight: 0.28
Height: 0.21 Width: 6.00 Depth: 9.00
Language: English
This book presents an in-depth experimental study of the behavior of SiC JFET transistors for demanding aerospace applications. A complete methodology is described, including the design of an automated test bench via LabView, robustness tests to determine the critical energy, and accelerated aging tests to monitor the evolution of electrical parameters. The results obtained highlight reliable degradation indicators and open up interesting prospects for the design of more resistant electronic systems in extreme environments.

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Ben Salah, Tarek

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Technology & Engineering