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Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem

Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem

Paperback

Technology & EngineeringBiologyGeneral Science

ISBN10: 3319819860
ISBN13: 9783319819860
Publisher: Springer
Published: May 30 2018
Pages: 196
Weight: 0.66
Height: 0.44 Width: 6.14 Depth: 9.21
Language: English
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.

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