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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
An Overview of X-Ray Analysis Technology

An Overview of X-Ray Analysis Technology

Ruizhi, Wu
Wang, Zhenqiang

Paperback

Technology & Engineering

PREORDER - Expected ship date November 1, 2026

ISBN10: 0443493324
ISBN13: 9780443493324
Publisher: Elsevier
Published: Nov 1 2026
Pages: 300
Language: English
An Overview of X-ray Analysis Technology introduces the basic theoretical knowledge of X-ray physics, X-ray diffraction direction and intensity, polycrystalline X-ray diffraction analysis, etc. Various X-ray techniques commonly used in current scientific research are introduced in the book, including the use of X-ray diffraction technology to analyze the phase, residual stress, grain size, dislocation density, texture, etc. of materials, as well as the use of X-ray photoelectron spectroscopy to analyze the types and contents of surface elements of materials. The book also introduces the three-dimensional X-ray microscopy analysis method developed in recent years based on electronic computed tomography technology. Thee technologies covered introduce basic principles, methods, experimental operations, and case analysis.

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