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612-822-4611
Nanoscale Redox Reaction at Metal/Oxide Interface: A Case Study on Schottky Contact and Reram

Nanoscale Redox Reaction at Metal/Oxide Interface: A Case Study on Schottky Contact and Reram

Paperback

Series: Nims Monographs

Technology & Engineering

ISBN10: 4431548491
ISBN13: 9784431548492
Publisher: Springer Nature
Published: May 22 2020
Pages: 89
Weight: 0.35
Height: 0.22 Width: 6.14 Depth: 9.21
Language: English
General introduction.- Changes in Schottky barrier height behavior of Pt-Ru alloy contacts on single-crystal ZnO.- Surface passivation effect on Schottky contact formation of oxide semiconductors.- Bias-induced interfacial redox reaction in oxide-based resistive random access memory structure.- Switching control of oxide-based resistive random access memory by valence state control of oxide.- Combinatorial thin film synthesis for new nanoelectronics materials.- General summary.

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