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Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield

Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield

Hardcover

Technology & EngineeringGeneral Computers

ISBN10: 1461417481
ISBN13: 9781461417484
Publisher: Springer Nature
Published: Sep 27 2012
Pages: 172
Weight: 0.85
Height: 0.60 Width: 6.20 Depth: 9.20
Language: English
Introduction.- Variability in Nanometer Technologies and Impact on SRAM.- Variarion-Tolerant SRAM Write and Read Assist Techniques.- Reducing SRAM Power using Fine-Grained Wordline Pulse Width Control.- A Methodology for Statistical Estimation of Read Access Yield in SRAMs.- Characterization of SRAM Sense Amplifier Input Offset for Yield Prediction.

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