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Nanometer Technology Designs: High-Quality Delay Tests

Nanometer Technology Designs: High-Quality Delay Tests

Paperback

Technology & EngineeringGeneral Computers

ISBN10: 1441945598
ISBN13: 9781441945594
Publisher: Springer Nature
Published: Dec 14 2011
Pages: 281
Weight: 0.93
Height: 0.63 Width: 6.14 Depth: 9.21
Language: English

Adopting new fabrication technologies not only provides higher integration and enhances performance, but also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz timing-related defects havv become a high proportion of the total chip defects. For nanometer technology designs, the stuck-at fault test alone cannot ensure a high quality level of chips. At-speed tests using the transition fault model has become a requirement in technologies below 180nm.

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