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    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Noise in Bipolar Junction Transistors at Cryogenic Temperatures.

Noise in Bipolar Junction Transistors at Cryogenic Temperatures.

Wade, Thomas

Paperback

Technology & Engineering

ISBN10: 0530019485
ISBN13: 9780530019482
Publisher: Dissertation Discovery Co
Published: Dec 8 2019
Pages: 258
Weight: 1.33
Height: 0.54 Width: 8.50 Depth: 11.00
Language: English
Abstract:

Fluctuation phenomenon (both thermal and shot noise) were measured in the junctions of bipolar junction transistors (BJT's) at liquid nitrogen temperatures and beyond.

Dissertation Discovery Company and the University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, Noise in Bipolar Junction Transistors at Cryogenic Temperatures. by Thomas Edward Wade, was obtained from the University of Florida and is being sold with permission from the author. A free digital copy of this work may also be found in the university's institutional repository, the IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.

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