Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Nistir 7771: Conformance Test Architecture for Biometric Data Intercharge Formats- Version Beta 2.0

Nistir 7771: Conformance Test Architecture for Biometric Data Intercharge Formats- Version Beta 2.0

U. S. Department of Commerce

Paperback

General Reference

ISBN10: 1496029224
ISBN13: 9781496029225
Publisher: Createspace
Published: Mar 4 2014
Pages: 40
Weight: 0.26
Height: 0.08 Width: 8.50 Depth: 11.02
Language: English
The success of biometric applications is particularly dependent on the interoperability of biometric systems. Deploying these systems requires a comprehensive portfolio of biometric standards developed in support of interoperability and data interchange. A number of these domestic and international standards have been published and others are under development. The existence of these standards alone is not enough to demonstrate that products meet the technical requirements specified in the standards. Conformance testing captures the technical description of a specification and measures whether an implementation faithfully implements the specification. The Computer Security Division of NIST/ITL supports conformity assessment efforts through active technical participation in the development of conformance testing methodology standards and the development of associated conformance test architectures (CTA) and test suites (CTS). This NIST IR discusses the technological characteristics of the recently released CTA Beta 2.0. This architecture supports CTSs such as those designed to test implementations of biometric data interchange data formats. The information provided includes CTA module communication methods, key CTA features and highlevel sequence diagrams such as testing and decoding operations. It also addresses an introduction to testing binary data, structure testing by groups of fields and a discussion on test cases. Ongoing work on related tools development is also presented.

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