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Multi-Run Memory Tests for Pattern Sensitive Faults

Multi-Run Memory Tests for Pattern Sensitive Faults

Hardcover

Technology & EngineeringGeneral Computers

ISBN10: 3319912038
ISBN13: 9783319912035
Publisher: Springer Nature
Published: Jul 18 2018
Pages: 135
Weight: 0.85
Height: 0.38 Width: 6.14 Depth: 9.21
Language: English

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.

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