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Metrology and Physical Mechanisms in New Generation Ionic Devices

Metrology and Physical Mechanisms in New Generation Ionic Devices

Paperback

Series: Springer Theses

Technology & EngineeringGeneral Science

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ISBN10: 3319819062
ISBN13: 9783319819068
Publisher: Springer
Published: Jun 7 2018
Pages: 175
Weight: 0.63
Height: 0.42 Width: 6.10 Depth: 9.25
Language: English
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.

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