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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Introduction to Advanced System-On-Chip Test Design and Optimization

Introduction to Advanced System-On-Chip Test Design and Optimization

Larsson, Erik

Hardcover

Series: Frontiers in Electronic Testing, Book 29

Technology & Engineering

ISBN10: 1402032072
ISBN13: 9781402032073
Publisher: Springer Nature
Published: Nov 7 2005
Pages: 388
Weight: 2.41
Height: 0.87 Width: 6.60 Depth: 9.80
Language: English

SOC test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SOC testing, discuses the modeling granularity and the implementation into EDA (electronic design automation) tools. It first introduces readers to test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. Then it discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. The final part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with core selection process. Intended for graduate students and PhD-students working in the test field, the manual also aids researchers and professors who would like to get into the area of SOC testing.

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