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Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach

Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach

Paperback

Series: Microsystems

Technology & Engineering

ISBN10: 1447160681
ISBN13: 9781447160687
Publisher: Springer Nature
Published: Feb 22 2014
Pages: 218
Weight: 0.70
Height: 0.60 Width: 6.00 Depth: 9.00
Language: English

Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the traditional method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced.

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