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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization

Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization

Paperback

Series: Springerbriefs in Applied Sciences and Technology

Technology & EngineeringGeneral Science

ISBN10: 9811044325
ISBN13: 9789811044328
Publisher: Springer Nature
Published: Oct 6 2017
Pages: 137
Weight: 0.49
Height: 0.33 Width: 6.14 Depth: 9.21
Language: English

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

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