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Elements of Electromigration: Electromigration in 3D IC technology

Elements of Electromigration: Electromigration in 3D IC technology

Hardcover

Technology & Engineering

ISBN10: 1032470275
ISBN13: 9781032470276
Publisher: CRC Press
Published: Jan 19 2024
Pages: 132
Weight: 0.95
Height: 0.38 Width: 6.69 Depth: 9.61
Language: English

In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.

Also from

Tu, King-Ning

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Technology & Engineering