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Digital Integrated Circuit Testing from a Quality Perspective

Digital Integrated Circuit Testing from a Quality Perspective

Hardcover

Series: Electrical Engineering

Technology & Engineering

ISBN10: 0442006438
ISBN13: 9780442006433
Publisher: Springer Nature
Published: Aug 31 1993
Pages: 180
Weight: 1.05
Height: 0.65 Width: 6.24 Depth: 9.72
Language: English
Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a

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Technology & Engineering